Insulators at the ultrathin limit: electronic structure studied by scanning tunnelling microscopy and scanning tunnelling spectroscopy
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چکیده
منابع مشابه
Insulators at the ultrathin limit: electronic structure studied by scanning tunnelling microscopy and scanning tunnelling spectroscopy
Considerable progress has been made recently, using scanning tunnelling microscopy (STM), scanning tunnelling spectroscopy (STS) and local density functional theory (DFT), in examining the atomic structure and electronic properties of ultrathin insulating films. This article reviews pertinent results to date with special emphasis on ultrathin MgO films on Ag(001) surfaces. Using STS, the layer-...
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ژورنال
عنوان ژورنال: Journal of Physics: Condensed Matter
سال: 2004
ISSN: 0953-8984,1361-648X
DOI: 10.1088/0953-8984/16/4/r02